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Testability Concepts for Digital ICs: The Macro Test Approach

F P M Beenker , R G Bennetts , A P Thijssen

30 novembre 1995

220,95 $

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Description

Langue

anglais

Pages

212

Frontiers in Electronic Testing

Publié par: Springer US

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9780792396581

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