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Timing Performance Of Nanometer Digital Circuits Under Process Variations

Victor Champac Couverture souple

189,95 $

3 formats disponibles

Efficient Branch and Bound Search with Application to Computer-Aided Design

Michael L. Xinghao Chen Couverture souple

160,95 $

2 formats disponibles

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Manoj Sachdev Couverture souple

321,50 $

2 formats disponibles

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

M. Bushnell Couverture souple

204,50 $

2 formats disponibles

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

R. Dean Adams Couverture souple

248,50 $

2 formats disponibles

Test Resource Partitioning for System-on-a-Chip

Vikram Iyengar Couverture souple

160,95 $

2 formats disponibles

Verification by Error Modeling: Using Testing Techniques in Hardware Verification

Katarzyna Radecka Couverture souple

160,95 $

2 formats disponibles

On-Line Testing for VLSI

Hardcover

142,95 $

Advances in Electronic Testing: Challenges and Methodologies

Couverture souple

220,95 $

2 formats disponibles

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Alfredo Benso Couverture souple

248,50 $

2 formats disponibles

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici Couverture souple

160,95 $

2 formats disponibles

On-Line Testing for VLSI

Michael Nicolaidis Couverture souple

160,95 $

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Said Hamdioui Couverture souple

160,95 $

2 formats disponibles

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Krishnendu Chakrabarty Couverture souple

160,95 $

2 formats disponibles

Introduction to Advanced System-on-Chip Test Design and Optimization

Erik Larsson Hardcover

248,50 $

Testability Concepts for Digital ICs: The Macro Test Approach

F.p.m. Beenker Couverture souple

248,50 $

2 formats disponibles

Soft Errors in Modern Electronic Systems

Michael Nicolaidis Couverture souple

248,50 $

3 formats disponibles

Research Perspectives and Case Studies in System Test and Diagnosis

John W. Sheppard Couverture souple

248,50 $

2 formats disponibles

Elements of STIL: Principles and Applications of IEEE Std. 1450

Gregory A. Maston Couverture souple

248,50 $

2 formats disponibles

Design for AT-Speed Test, Diagnosis and Measurement

Benoit Nadeau-Dostie Couverture souple

248,50 $

2 formats disponibles

Fault-Tolerance Techniques for SRAM-Based FPGAs

Fernanda Lima Kastensmidt Couverture souple

160,95 $

2 formats disponibles

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Jitendra B. Khare Couverture souple

160,95 $

2 formats disponibles

A Designer’s Guide to Built-In Self-Test

Charles E. Stroud Couverture souple

285,95 $

2 formats disponibles

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Timing Performance Of Nanometer Digital Circuits Under Process Variations

Efficient Branch and Bound Search with Application to Computer-Aided Design

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Test Resource Partitioning for System-on-a-Chip

Verification by Error Modeling: Using Testing Techniques in Hardware Verification

On-Line Testing for VLSI

Advances in Electronic Testing: Challenges and Methodologies

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

On-Line Testing for VLSI

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Introduction to Advanced System-on-Chip Test Design and Optimization

Testability Concepts for Digital ICs: The Macro Test Approach

Soft Errors in Modern Electronic Systems

Research Perspectives and Case Studies in System Test and Diagnosis

Elements of STIL: Principles and Applications of IEEE Std. 1450

Design for AT-Speed Test, Diagnosis and Measurement

Fault-Tolerance Techniques for SRAM-Based FPGAs

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

A Designer’s Guide to Built-In Self-Test

Frontiers in Electronic Testing

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Timing Performance Of Nanometer Digital Circuits Under Process Variations

Efficient Branch and Bound Search with Application to Computer-Aided Design

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Test Resource Partitioning for System-on-a-Chip

Verification by Error Modeling: Using Testing Techniques in Hardware Verification

On-Line Testing for VLSI

Advances in Electronic Testing: Challenges and Methodologies

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

On-Line Testing for VLSI

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Introduction to Advanced System-on-Chip Test Design and Optimization

Testability Concepts for Digital ICs: The Macro Test Approach

Soft Errors in Modern Electronic Systems

Research Perspectives and Case Studies in System Test and Diagnosis

Elements of STIL: Principles and Applications of IEEE Std. 1450

Design for AT-Speed Test, Diagnosis and Measurement

Fault-Tolerance Techniques for SRAM-Based FPGAs

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

A Designer’s Guide to Built-In Self-Test