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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Manoj Sachdev , Jos Pineda De Gyvez

10 novembre 2010

321,50 $

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Description

Langue

anglais

Pages

328

Frontiers in Electronic Testing

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781441942852

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