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Intrinsic Point Defects, Impurities, And Their Diffusion In Silicon

Peter Pichler

2 juin 2004

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Description

Langue

anglais

Pages

554

Computational Microelectronics

Publié par: Springer Vienna

Dimensions à l’expédition: 10" H x 7" W x 1" L

ISBN: 9783211206874

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