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Defects In High-k Gate Dielectric Stacks: Nano-electronic Semiconductor Devices

Evgeni Gusev

27 janvier 2006

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Description

Langue

anglais

Pages

492

NATO Science Series II: Mathematics, Physics and Chemistry

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781402043666

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