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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

Yasuo Cho

21 mai 2020

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Description

Langue

anglais

Pages

256

Woodhead Publishing Series in Electronic and Optical Materials

Publié par: Woodhead Publishing

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9780128172469

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