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Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield

Mohamed Abu Rahma , Mohab Anis

27 septembre 2012

160,95 $

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Description

Langue

anglais

Pages

172

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781461417484

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