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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Stefan Rein

19 octobre 2010

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Description

Langue

anglais

Pages

492

Springer Series in Materials Science

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9783642064531

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