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Kelvin Probe Force Microscopy: From Single Charge Detection To Device Characterization

Sascha Sadewasser Édition : Thilo Glatzel

19 mars 2018

321,50 $

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Description

Langue

anglais

Pages

521

Springer Series in Surface Sciences

Publié par: Springer Nature

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9783319756868

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Évaluation éditoriale

thilo glatzel

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