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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Édition : Sascha Sadewasser

10 mars 2018

241,99 $ ~~Réduction sur le prix courant 301,96 $ à~~

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Description

Langue

anglais

Springer Series in Surface Sciences

Publié par: Springer International Publishing

ISBN: 9783319756875

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Évaluation éditoriale

sascha sadewasser

Auteur

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