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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

Pradeep LALL , Michael G. Pecht , Edward B. Hakim

19 juin 2019

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Description

Langue

anglais

Pages

336

Publié par: CRC Press

Dimensions à l’expédition: 10" H x 7" W x 1" L

ISBN: 9780367400972

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