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Evolution of Thin Film Morphology: Modeling and Simulations

Matthew Pelliccione , Toh-ming Lu

19 novembre 2010

248,50 $

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Description

Langue

anglais

Pages

206

Springer Series in Materials Science

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9781441925800

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