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Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination

3 octobre 2013

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Description

Langue

anglais

Pages

214

Springer Tracts in Modern Physics

Publié par: Springer/Sci-Tech/Trade

Dimensions à l’expédition: 9" H x 6" W x 1" L

ISBN: 9783662146378

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