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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Said Hamdioui
Mar 31, 2004
$160.95
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Overview

Appropriate for
Language
English
No. of Pages
221
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781402077524
Life stage: null

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