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Free Preview of Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

Adam Foster , Werner A. Hofer
Nov 23, 2010
$248.50
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Overview

Appropriate for
Language
English
No. of Pages
282
NanoScience and Technology
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781441923066
Life stage: null

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