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Power-constrained Testing Of Vlsi Circuits: A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici , Bashir M. Al-Hashimi
Feb 28, 2003
$160.95
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Overview

Appropriate for
Language
English
No. of Pages
178
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 12" H x 8" W x 1" L
ISBN: 9781402072352
Life stage: null

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