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Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces

Sascha Sadewasser Edited by Thilo Glatzel
Oct 22, 2011
$160.95
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Overview

Appropriate for
Language
English
No. of Pages
334
Springer Series in Surface Sciences
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9783642225659
Life stage: null

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