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Hierarchical Modeling for VLSI Circuit Testing

Debashis Bhattacharya , John P Hayes
Sep 26, 2011
$142.95
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Overview

Appropriate for
Language
No. of Pages
160
The Springer International Engineering and Computer Science
Publisher: Springer US
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781461288190
Life stage: null

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