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Characterization Methods for Submicron MOSFETs

Edited by Hisham Haddara
Jan 31, 1996
$220.95
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Overview

Appropriate for
Language
No. of Pages
232
The Springer International Engineering and Computer Science
Publisher: Springer US
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9780792396956
Life stage: null

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