Buy Now, In-Store Pick Up Only

  • Front cover_Characterization Methods for Submicron MOSFETs
Free Preview of Characterization Methods for Submicron MOSFETs

Characterization Methods for Submicron MOSFETs

Edited by Hisham Haddara
Jan 31, 1996
$220.95
Online pricing. Prices and offers may vary in store.
.
.    Learn More
This product requires a minimum order of  1
Final Sale. No returns or exchanges.
This item will be shipped by appointment through our delivery partner.

Ship to me

Checking availability…

Buy now & pick up in store

Checking availability…

Find it in store

Checking availability…

Earn 1,105 points and enjoy extra savings with plum+. 

Overview

Appropriate for
Language
No. of Pages
232
The Springer International Engineering and Computer Science
Publisher: Springer US
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9780792396956
Life stage: null

You May Also Like

Ratings & Reviews

  • bvseo_sdk, dw_cartridge, 18.2.0, p_sdk_3.2.0
  • CLOUD, getReviews, 6ms
  • reviews, product
  • bvseo-msg: Unsuccessful GET. status = 'ERROR', msg = 'Not Found.'; Unsuccessful GET. status = 'ERROR', msg = 'Not Found.';

Editorial reviews

hisham haddara

Author

Others Also Bought

Characterization Methods for Submicron MOSFETs 23BD9107-4847-4523-9DF1-55358BF61F71
Characterization Methods for Submicron MOSFETs
https://dynamic.indigoimages.ca/v1/books/books/0792396952/1.jpg
220.95
Characterization Methods for Submicron MOSFETs
https://dynamic.indigoimages.ca/v1/books/books/1461285844/1.jpg
220.95