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  • Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
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Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Xiaowei Li , Guihai Yan , Cheng Liu
Mar 03, 2024
$321.50
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Overview

Appropriate for
Language
English
No. of Pages
304
Publisher: Springer Nature
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9789811985539
Life stage: null

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