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Lock-in Thermography: Basics And Use For Evaluating Electronic Devices And Materials

Otwin Breitenstein , Wilhelm Warta , Martin C. Schubert
Jan 22, 2019
$262.95
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Overview

Appropriate for
Language
English
No. of Pages
321
Springer Series In Advanced Microelectronics
Publisher: Springer Nature
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9783319998244
Life stage: null

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