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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici , Bashir M. Al-Hashimi
Dec 09, 2010
$160.95
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Overview

Appropriate for
Language
English
No. of Pages
178
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781441953155
Life stage: null

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