Buy Now, In-Store Pick Up Only

  • Front cover_Defect Recognition And Image Processing In Semiconductors 1997
Free Preview of Defect Recognition And Image Processing In Semiconductors 1997: Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September

Defect Recognition And Image Processing In Semiconductors 1997: Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September

J. Doneker , I. Rechenberg
Jan 01, 1998
$616.00
Online pricing. Prices and offers may vary in store.
.
.
This product requires a minimum order of  1
Final Sale. No returns or exchanges.
This item will be shipped by appointment through our delivery partner.

Ship to me

Checking availability…

Buy now & pick up in store

Checking availability…

Find it in store

Checking availability…

Earn 3,080 points and enjoy extra savings with plum+. 

Overview

Appropriate for
Language
English
No. of Pages
524
Publisher: Taylor and Francis
Shipping dimensions: 6" H x 9" W x 1" L
ISBN: 9780750305006
Life stage: null

You May Also Like

Ratings & Reviews

  • bvseo_sdk, dw_cartridge, 18.2.0, p_sdk_3.2.0
  • CLOUD, getReviews, 5ms
  • reviews, product
  • bvseo-msg: Unsuccessful GET. status = 'ERROR', msg = 'Not Found.'; Unsuccessful GET. status = 'ERROR', msg = 'Not Found.';

Editorial reviews

Author

Others Also Bought