Buy Now, In-Store Pick Up Only

  • Testability Concepts for Digital ICs: The Macro Test Approach
Free Preview of Testability Concepts for Digital ICs: The Macro Test Approach

Testability Concepts for Digital ICs: The Macro Test Approach

F P M Beenker , R G Bennetts , A P Thijssen
Nov 30, 1995
$220.95
Online pricing. Prices and offers may vary in store.
.
.    Learn More
This product requires a minimum order of  1
Final Sale. No returns or exchanges.
This item will be shipped by appointment through our delivery partner.

Ship to me

Checking availability…

Buy now & pick up in store

Checking availability…

Find it in store

Checking availability…

Earn 1,105 points and enjoy extra savings with plum+. 

Overview

Appropriate for
Language
English
No. of Pages
212
Frontiers in Electronic Testing
Publisher: Springer US
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9780792396581
Life stage: null

You May Also Like

Ratings & Reviews

  • bvseo_sdk, dw_cartridge, 18.2.0, p_sdk_3.2.0
  • CLOUD, getReviews, 5ms
  • reviews, product
  • bvseo-msg: Unsuccessful GET. status = 'ERROR', msg = 'Not Found.'; Unsuccessful GET. status = 'ERROR', msg = 'Not Found.';

Editorial reviews

Author

Others Also Bought

Testability Concepts for Digital ICs: The Macro Test Approach C5190F8E-9F24-4FD8-A3B7-D60143BA4E86
Testability Concepts for Digital ICs: The Macro Test Approach
https://dynamic.indigoimages.ca/v1/books/books/1461360048/1.jpg
248.5
Testability Concepts for Digital ICs: The Macro Test Approach
https://dynamic.indigoimages.ca/v1/books/books/0792396588/1.jpg
220.95