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  • Front cover_Secondary Ion Mass Spectrometry SIMS II
Free Preview of Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979

Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979

A. Benninghoven Edited by C.A. Jr. Evans , R.A. Powell
Dec 13, 2011
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Overview

Appropriate for
Language
English
No. of Pages
300
Springer Series in Chemical Physics
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9783642618734
Life stage: null

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