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Applications And Metrology At Nanometer-scale 2: Measurement Systems, Quantum Engineering And Rbdo Method

Pierre-Richard Dahoo , Philippe Pougnet , Abdelkhalak El Hami
Apr 06, 2021
$217.95
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Overview

Appropriate for
Language
English
No. of Pages
288
Publisher: Wiley
Shipping dimensions: 0" H x 0" W x 0" L
ISBN: 9781786306876
Life stage: null

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