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Anomalous X-ray Scattering For Materials Characterization: Atomic-scale Structure Determination

Yoshio Waseda
Sep 11, 2002
$321.50
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Overview

Appropriate for
Language
English
No. of Pages
214
Springer Tracts in Modern Physics
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9783540434436
Life stage: null

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