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  • Front cover_An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Sarah Fearn
Oct 16, 2015
$42.44
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Overview

Appropriate for
Language
English
No. of Pages
66
Iop Concise Physics
Publisher: Morgan & Claypool Publishers LLC-IOP
Shipping dimensions: 10" H x 7" W x 1" L
ISBN: 9781681740249
Life stage: null

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