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Advances in X-Ray Analysis: Volume 32

Edited by Charles S Barrett , J V Gilfrich , Ron Jenkins
Jun 01, 1989
$285.95
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Overview

Appropriate for
Language
No. of Pages
682
Publisher: Springer US
Shipping dimensions: 10" H x 7" W x 2" L
ISBN: 9780306432361
Life stage: null

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