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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Manoj Sachdev , Jos Pineda De Gyvez
Jun 21, 2007
$321.50
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Overview

Appropriate for
Language
English
No. of Pages
328
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9780387465463
Life stage: null

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